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Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization
Journal of Electronic Testing ( IF 0.9 ) Pub Date : 2022-07-25 , DOI: 10.1007/s10836-022-06013-y
Syed Usman Amin, Muhammad Aaquib Shahbaz, Syed Arsalan Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Zain Warsi, Naveed

A temperature and humidity-controlled test bench for a wirelessly-powered ultra-low-power temperature sensor IC is presented. It consists of a closed metallic structure of 0.02 m3, forming a faraday-cage around the design under test (DUT), thermally insulated using Polyethylene foam, to provide electromagnetic interference (EMI) clean and thermally stable test environment with an operating temperature range of -10 °C to 100 °C. The temperature control with a settling accuracy of ± 0.6 °C is achieved with air-cooled 100 W Peltier modules, having fast dynamics to reach 95% of the required temperature within 15 min. The humidity is controlled by air circulation through a desiccant pocket, managed at around 15% to avoid water droplets during defrosting. A controllable vacuum of ~ 1.3 kPa is achieved through a vacuum pump when < 15% of de-humification is needed. The system operates at a lower power consumption of 30 W during the temperature retention phase, with acoustic noise of 58 dB-SPL achieved.



中文翻译:

用于温度传感器表征的温湿度控制测试台

介绍了一种用于无线供电的超低功耗温度传感器 IC 的温湿度控制测试台。它由一个 0.02 m 3的封闭金属结构组成,在被测设计 (DUT) 周围形成一个法拉第笼,使用聚乙烯泡沫进行热绝缘,以提供电磁干扰 (EMI) 清洁和热稳定的测试环境,工作温度范围为 -10 °C 至 100 °C。使用风冷 100 W Peltier 模块实现稳定精度为 ± 0.6 °C 的温度控制,具有快速动态特性,可在 15 分钟内达到所需温度的 95%。湿度由通过干燥剂袋的空气循环控制,控制在 15% 左右,以避免在除霜过程中出现水滴。当需要 < 15% 的除湿量时,可通过真空泵实现约 1.3 kPa 的可控真空。该系统在温度保持阶段以 30 W 的较低功耗运行,实现了 58 dB-SPL 的噪声。

更新日期:2022-07-26
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