Abstract

The mechanism of the self-isolation of beams of accelerated charged particles during their sliding interaction with a dielectric surface is considered. This phenomenon is observed experimentally when ion and electron beams are passed through cylindrical and flat dielectric capillaries. Beams of charged particles, which are incident on the dielectric “wall” at small angles, charge it so that the beams pass through without contact. The explanation of this phenomenon is based on the inhomogeneity of the electric-charge distribution on the wall surface. A charged wall is considered to be a set of point charges forming a planar Coulomb crystal on the surface. Computer simulations show that the interaction of passing charged particles (protons), pressed against the dielectric surface by an external electric field, with a flat lattice of charges (taking into account the image charges), repels them from the surface. The force that repels the beam particles from the surface is the Gaponov–Miller gradient force that occurs when charged particles move in a rapidly alternating electric field. We estimate the minimum charge density on the surface at which the phenomenon of the self-isolation of beams can be observed. An experiment is also carried out, according to the results of which the value of the coupling coefficient of the charge density on the surface and the electric-field strength pressing protons to the surface is determined.

中文翻译：

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解释质子束沿介质表面滑动的自隔离机制的半经验方法

摘要

考虑了加速带电粒子束在与电介质表面滑动相互作用过程中的自隔离机制。当离子和电子束通过圆柱形和扁平介电毛细管时，实验观察到这种现象。以小角度入射到电介质“壁”上的带电粒子束对其进行充电，从而使光束在不接触的情况下通过。这种现象的解释是基于壁面上电荷分布的不均匀性。带电壁被认为是在表面上形成平面库仑晶体的一组点电荷。计算机模拟表明，通过带电粒子（质子）的相互作用，通过外部电场压在电介质表面上，具有平坦的电荷晶格（考虑到图像电荷），将它们从表面排斥。将射束粒子从表面排斥的力是加波诺夫-米勒梯度力，当带电粒子在快速交变电场中移动时会产生这种力。我们估计可以观察到光束自隔离现象的表面上的最小电荷密度。还进行了实验，根据实验结果确定了表面电荷密度与将质子压向表面的电场强度的耦合系数值。将射束粒子从表面排斥的力是加波诺夫-米勒梯度力，当带电粒子在快速交变电场中移动时会产生这种力。我们估计可以观察到光束自隔离现象的表面上的最小电荷密度。还进行了实验，根据实验结果确定了表面电荷密度与将质子压向表面的电场强度的耦合系数值。将射束粒子从表面排斥的力是加波诺夫-米勒梯度力，当带电粒子在快速交变电场中移动时会产生这种力。我们估计可以观察到光束自隔离现象的表面上的最小电荷密度。还进行了实验，根据实验结果确定了表面电荷密度与将质子压向表面的电场强度的耦合系数值。