Polarization-resolved photodetection in a compact footprint is of great interest for ultraminiaturized polarimeters to be used in a wide range of applications. However, probing the states of polarization (SOP) in materials with natural anisotropy are usually weak, limited by the material's natural dichroism or diattenuation. Here, a twisted unipolar-barrier van der Waals heterostructure (vdWH) to construct a bias-switchable polarization detection for retrieval of full SOP (from 0 to 180°) for linear polarized incident light is reported. As a demonstration example, this study realizes the concept in a b-AsP/WS₂/b-AsP vdWH relying on the natural anisotropic properties of the materials without using additional plasmonic/metasurface nanostructures to realize linear polarimetry in the mid-infrared range. Polarimetric imaging is further demonstrated with the developed linear polarimetry by directly displaying the Jones-vector-described SOP distribution of certain target object. This method, with the capabilities of detecting full linear SOP, is promising for the next-generation on-chip miniaturized polarimeters.

中文翻译：

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用于全线偏振检测的具有自然各向异性的可切换单极势垒范德华异质结构

在紧凑的占位面积中进行偏振分辨光电检测对于在广泛应用中使用的超小型旋光仪具有极大的兴趣。然而，探测具有自然各向异性的材料中的极化状态 (SOP) 通常很弱，受到材料的自然二色性或衰减的限制。在这里，报告了一种扭曲的单极势垒范德华异质结构 (vdWH)，用于构建偏置可切换偏振检测，用于检索线性偏振入射光的全 SOP（从 0 到 180°）。作为一个示范例子，这项研究在 b-AsP/WS _{2中实现了这个概念}/b-AsP vdWH 依靠材料的天然各向异性特性，无需使用额外的等离子体/超表面纳米结构来实现中红外范围内的线性偏振测量。通过直接显示某些目标对象的琼斯矢量描述的 SOP 分布，进一步证明了偏振成像与开发的线性偏振法。该方法具有检测全线性SOP的能力，有望用于下一代片上微型旋光仪。