We report on the development of a low-energy x-ray phase-based microscope using intensity-modulation masks for single-shot retrieval of three contrast channels: transmission, refraction, and ultra-small-angle scattering or dark field. The retrieval method is based on beam tracking, an incoherent and phase-based imaging approach. We demonstrate that the spatial resolution of this imaging system does not depend on focal spot size nor detector pixel pitch, as opposed to conventional and propagation-based x-ray imaging, and it is only dependent on the mask aperture size. This result enables the development of a multi-resolution microscope where multi-scale samples can be explored on different length scales by adjusting only the mask aperture size, without other modifications. Additionally, we show an extended capability of the system to resolve periodic structures below the resolution limit imposed by the mask apertures, which potentially extends dark-field imaging beyond its conventional use.

中文翻译：

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基于实验室的低能量多模态 X 射线显微镜，具有用户定义的分辨率

我们报告了一种低能量 X 射线相位显微镜的开发，该显微镜使用强度调制掩模对三个对比度通道进行单次检索：透射、折射和超小角度散射或暗场。检索方法基于光束跟踪，一种非相干和基于相位的成像方法。我们证明该成像系统的空间分辨率不依赖于焦斑大小或探测器像素间距，这与传统的基于传播的 X 射线成像相反，它仅取决于掩模孔径大小。这一结果使多分辨率显微镜的开发成为可能，通过仅调整掩模孔径大小，无需其他修改，就可以在不同长度尺度上探索多尺度样本。此外，