In this work a new nanoscale surface marking technique, namely electron beam damage induced surface marking (EBDISM), is developed and tested for the first time on a fine-grained pure Mg surface. This technique utilizes focused high-energy electron beam of a scanning electron microscope to “burn” dense arrays of nano-scale grid patterns on the sample surface, and it is proved to be very effective for identifying and measuring localised deformation behaviours. However, the surface marking deposited by EBDISM is not permanent and it tends to deteriorate overtime. Cheap, easy to use and versatile, the EBDISM technique has a huge potential for quantitative measurement of strain field and nano-scale deformation analysis.

在这项工作中，一种新的纳米级表面标记技术，即电子束损伤诱导表面标记（EBDISM），首次在细晶粒纯镁表面上开发和测试。该技术利用扫描电子显微镜的聚焦高能电子束在样品表面“燃烧”密集的纳米级网格图案阵列，并被证明对识别和测量局部变形行为非常有效。但是，EBDISM 沉积的表面标记不是永久性的，并且随着时间的推移会变质。EBDISM 技术便宜、易于使用且用途广泛，在应变场定量测量和纳米级变形分析方面具有巨大潜力。