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Growth of Tellurium Nanobelts on h-BN for p-type Transistors with Ultrahigh Hole Mobility
Nano-Micro Letters ( IF 26.6 ) Pub Date : 2022-04-19 , DOI: 10.1007/s40820-022-00852-2
Peng Yang 1, 2 , Jiajia Zha 2 , Guoyun Gao 3 , Long Zheng 4 , Haoxin Huang 2 , Yunpeng Xia 2 , Songcen Xu 2 , Tengfei Xiong 5 , Zhuomin Zhang 6 , Zhengbao Yang 6 , Ye Chen 4 , Dong-Keun Ki 3 , Juin J Liou 1 , Wugang Liao 1 , Chaoliang Tan 2, 7
Affiliation  

  • The growth of high-quality single-crystalline Te nanobelts is reported by introducing atomically flat hexagonal boron nitride (h-BN) nanoflakes into the chemical vapor deposition system as the growth substrate.

  • The field-effect transistor based on Te grown on h-BN exhibits an ultrahigh hole mobility up to 1370 cm2 V−1 s−1 at room temperature.



中文翻译:

在具有超高空穴迁移率的 p 型晶体管的 h-BN 上生长碲纳米带

  • 通过将原子级扁平的六方氮化硼 (h-BN) 纳米片引入化学气相沉积系统作为生长基底,报道了高质量单晶 Te 纳米带的生长。

  • 基于在 h-BN 上生长的 Te 的场效应晶体管在室温下表现出高达 1370 cm 2  V -1  s -1的超高空穴迁移率。

更新日期:2022-04-20
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