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Investigation of trapped charges profile for an irradiated insulated material
Journal of Microscopy ( IF 2 ) Pub Date : 2022-03-29 , DOI: 10.1111/jmi.13103
Ali S Mahdi 1 , Hassan N Al-Obaidi 2 , Huda K Husien 2
Affiliation  

The process of examining and analysing insulating materials using a scanning electron microscope usually accompanied by an important phenomenon called the mirror effect or charging effects. Such effects arise due to the ability of insulators to trapping charges at the sample surface for a period. The accumulation of charges leads to creating an electric potential that may be strong enough to deflect incident electrons in the same way a convex mirror scatters light. The created potential depends mainly on the charge amount, charges accumulation profile and the way by which the charges arranging themselves. Present work aims at exploring the influences of the charges distribution profile and their arrangements.

中文翻译:

辐照绝缘材料俘获电荷分布的研究

使用扫描电子显微镜检查和分析绝缘材料的过程通常伴随着一种重要的现象,称为镜面效应或充电效应。这种效应是由于绝缘体在样品表面捕获电荷一段时间的能力而产生的。电荷的积累导致产生一个足以使入射电子偏转的电势,就像凸面镜散射光一样。所产生的电位主要取决于电荷量、电荷累积曲线和电荷排列方式。目前的工作旨在探索费用分布概况及其安排的影响。
更新日期:2022-03-29
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