Test time, test data volume, and test power have been a major concern in Serial Access Scan (SAS) based manufacturing test. Alternatively, the Random Access Scan (RAS) architecture has been proposed to mitigate some of these problems. However, some of the drawbacks, particularly the area and routing congestion of RAS puts a limit on its industry adoption. In this work, we propose a framework of a new scan architecture which we name as Joint-scan that aims to combine both the SAS and RAS to harness the best out of each of the architectures. The principle is to harness the advantage of the area from SAS architecture and the advantage of test power from RAS architecture. The other two parameters, test time and test data volume, are minimized by fine-tuning the proposed scan architecture. The architecture is also configurable to take the design constraints into consideration. Effectiveness of the architecture is experimentally demonstrated on the scaled ISCAS 89 circuits.

测试时间、测试数据量和测试功率一直是基于串行访问扫描 (SAS) 的制造测试的主要关注点。或者，已提出随机访问扫描 (RAS) 架构来缓解其中一些问题。然而，RAS 的一些缺点，特别是区域和路由拥塞限制了其行业采用。在这项工作中，我们提出了一个新的扫描架构框架，我们将其命名为联合扫描，旨在结合 SAS 和 RAS 以充分利用每种架构的优势。其原理是利用SAS架构的区域优势和RAS架构的测试能力优势。其他两个参数，测试时间和测试数据量，通过微调所提出的扫描架构来最小化。该架构也是可配置的，以考虑设计约束。该架构的有效性在按比例缩放的 ISCAS 89 电路上进行了实验证明。