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Virtual speckle-based X-ray phase-contrast and dark-field imaging with digital phantoms
Optics Express ( IF 3.8 ) Pub Date : 2021-11-30 , DOI: 10.1364/oe.444562
Somayeh Saghamanesh 1 , Robert Zboray 1
Affiliation  

We demonstrate two versatile, flexible, and accurate frameworks based on numerical and Monte Carlo approaches to simulate the X-ray speckle-based (SBI) technique for lab-based systems. The established tools can reproduce experimental setups in a cone-beam geometry and with polychromatic sources. Furthermore, they are computationally efficient to enable a fast virtual multi-modal tomography of digitized inhomogeneous phantoms. The proposed methods were evaluated and validated by analytical and experimental data for various samples. The Monte Carlo approach provides a realistic and accurate simulation, which is useful in diffuser design and dosimetry studies, while the numerical method is very efficient for parametric and tomographic studies. These approaches will be used for the optimization of lab-based X-ray SBI setups and generating sample images for enhancing phase retrieval algorithms.

中文翻译:

基于虚拟散斑的 X 射线相衬和暗场成像与数字体模

我们展示了两种基于数值和蒙特卡罗方法的多功能、灵活和准确的框架,以模拟实验室系统的 X 射线散斑 (SBI) 技术。已建立的工具可以在锥形束几何结构和多色源中重现实验设置。此外,它们的计算效率很高,可以实现数字化非均匀体模的快速虚拟多模态断层扫描。通过各种样品的分析和实验数据对所提出的方法进行了评估和验证。Monte Carlo 方法提供了真实准确的模拟,这在扩散器设计和剂量学研究中很有用,而数值方法对于参数和断层摄影研究非常有效。
更新日期:2021-12-06
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