Conventional structured illumination microscopy (SIM) utilizes a sinusoidal excitation pattern of frequency within the detection passband and provides a maximum of twofold resolution enhancement over the diffraction limit. A transmission approach proposed in an earlier publication [J. Phys. D 53, 044006 (2019) [CrossRef] ] to further improve the lateral resolution requires sequential higher frequency illumination patterns. However, the existing reconstruction algorithms fail to deliver appropriate reconstruction when the excitation frequency lies far from the passband boundary. Here, we present a correlation-based SIM reconstruction approach for sequential high-frequency illumination patterns even if the pattern frequency lies far from the passband limit. The scheme can be suitably implemented in a variety of custom-built systems where illumination frequency lies beyond the passband support (e.g., non-linear SIM and plasmonic SIM).

中文翻译：

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一种高空间带宽乘积结构照明显微镜系统的图像重建方法

传统的结构照明显微镜 (SIM) 在检测通带内利用频率的正弦激发模式，并在衍射极限上提供最大两倍的分辨率增强。在较早的出版物中提出的传输方法 [J. 物理 D 53 , 044006 (2019) [CrossRef] ] 进一步提高横向分辨率需要连续的更高频率的照明模式。然而，当激励频率远离通带边界时，现有的重建算法无法提供适当的重建。在这里，我们提出了一种基于相关性的 SIM 重建方法，用于连续高频照明模式，即使模式频率远离通带限制。该方案可以在照明频率超出通带支持范围的各种定制系统中适当实施（例如，非线性 SIM 和等离子体 SIM）。