Measuring the aberrations of optical systems is an essential step in the fabrication of high precision optical components. Such a characterization is usually based on comparing the device under investigation with a calibrated reference object. However, when working at the cutting-edge of technology, it is increasingly difficult to provide an even better or well-known reference device. In this manuscript we present a method for the characterization of high numerical aperture microscope objectives, functioning without the need of calibrated reference optics. The technique constitutes a nanoparticle, acting as a dipole-like scatterer, that is placed in the focal volume of the microscope objective. The light that is scattered by the particle can be measured individually and serves as the reference wave in our system. Utilizing the well-characterized scattered light as nearly perfect reference wave is the main idea behind this manuscript.

测量光学系统的像差是制造高精度光学元件的必要步骤。这种表征通常基于将研究中的设备与校准的参考对象进行比较。但是，在技术前沿工作时，越来越难以提供更好或众所周知的参考设备。在这份手稿中，我们提出了一种表征高数值孔径显微镜物镜的方法，无需校准参考光学元件即可运行。该技术构成了一个纳米粒子，充当偶极子状散射体，放置在显微镜物镜的焦体积中。被粒子散射的光可以单独测量，并作为我们系统中的参考波。