Electromechanical impedance (EMI) method has been widely used in recent years to evaluate the condition of structures. In this method, piezoelectric sensors are added to the structure to examine material properties. The impedance/admittance signals are recorded with the aid of the impedance analyzer without any conversion. When there is any change in structures, differences occur in these signals. Thus, changes in structures can be easily determined. It is known that residual stress plays a vital role in materials in terms of crack initiation, breakage, fatigue life, etc. In contrast, the detection of residual stress is time-consuming and it requires experience. This study reveals the effect of cutting parameters on residual stress and electromechanical impedance/admittance values. Firstly, hot ultrasonic-assisted turning was performed for Ti6Al4V material. A parametric study was carried out with different cutting depth, feed rate, and cutting speed. In the second stage, residual stress values measured by X-Ray diffraction (XRD) method and impedance/admittance values measured by an impedance analyzer were compared. In this context, empirical equations with their values between stress/impedance–admittance values have been derived. In general, it has been observed that stress values are significantly associated with impedance/admittance values and the highest correlation was obtained with the reactance values.

近年来，机电阻抗（EMI）方法被广泛用于评估结构的状况。在这种方法中，压电传感器被添加到结构中以检查材料特性。在阻抗分析仪的帮助下记录阻抗/导纳信号，无需任何转换。当结构发生任何变化时，这些信号就会出现差异。因此，可以很容易地确定结构的变化。众所周知，残余应力在材料的裂纹萌生、断裂、疲劳寿命等方面起着至关重要的作用。相比之下，残余应力的检测耗时且需要经验。本研究揭示了切削参数对残余应力和机电阻抗/导纳值的影响。首先，对 Ti6Al4V 材料进行了热超声辅助车削。对不同的切削深度、进给率和切削速度进行了参数研究。在第二阶段，通过X射线衍射（XRD）方法测量的残余应力值和阻抗分析仪测量的阻抗/导纳值进行比较。在这种情况下，已经推导出了具有应力/阻抗-导纳值之间的值的经验方程。一般来说，已经观察到应力值与阻抗/导纳值显着相关，并且与电抗值的相关性最高。将X射线衍射(XRD)法测得的残余应力值与阻抗分析仪测得的阻抗/导纳值进行比较。在这种情况下，已经推导出了具有应力/阻抗-导纳值之间的值的经验方程。一般来说，已经观察到应力值与阻抗/导纳值显着相关，并且与电抗值的相关性最高。将X射线衍射(XRD)法测得的残余应力值与阻抗分析仪测得的阻抗/导纳值进行比较。在这种情况下，已经推导出了具有应力/阻抗-导纳值之间的值的经验方程。一般来说，已经观察到应力值与阻抗/导纳值显着相关，并且与电抗值的相关性最高。