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Theoretical Prediction and Thin-Film Growth of the Defect-Tolerant Nitride Semiconductor YZn3N3
Chemistry of Materials ( IF 8.6 ) Pub Date : 2021-10-19 , DOI: 10.1021/acs.chemmater.1c02149
Ryosuke Kikuchi 1, 2 , Toru Nakamura 1 , Takahiro Kurabuchi 1 , Yasushi Kaneko 1 , Yu Kumagai 2 , Fumiyasu Oba 2
Affiliation  

Ternary zinc nitrides are of particular interest for solar energy conversion because they can be entirely manufactured from earth-abundant components and possess suitable band structures. Although exhaustive computational explorations and experimental verifications of ternary zinc nitrides have been reported, there have hitherto been no studies of YZn3N3. We conducted first-principles calculations to predict its crystal and electronic structures, optical properties, and defect chemistry. Our calculations reveal that YZn3N3 has a direct-type band structure with a band gap of 1.80 eV and that its native defects are unlikely to have a significant impact on the carrier lifetime. We also grew YZn3N3 films on glass substrates by reactive cosputtering and validated the theoretically predicted crystal structure. The experimentally determined band gap of YZn3N3 was 1.84 eV, close to the theoretical value.

中文翻译:

耐缺陷氮化物半导体YZn3N3的理论预测和薄膜生长

三元氮化锌对太阳能转换特别感兴趣,因为它们可以完全由地球上丰富的成分制成并具有合适的能带结构。尽管已经报道了对三元氮化锌进行了详尽的计算探索和实验验证,但迄今为止还没有关于 YZn 3 N 3 的研究。我们进行了第一性原理计算以预测其晶体和电子结构、光学特性和缺陷化学。我们的计算表明,YZn 3 N 3具有带隙为 1.80 eV 的直接型能带结构,并且其天然缺陷不太可能对载流子寿命产生重大影响。我们还种植了 YZn 3 N 3通过反应共溅射在玻璃基板上形成薄膜,并验证了理论预测的晶体结构。实验确定的 YZn 3 N 3 的带隙为 1.84 eV,接近理论值。
更新日期:2021-11-09
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