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High-Pressure and High-Temperature Synthesis and In Situ High-Pressure Synchrotron X-ray Diffraction Study of HfSi2
Inorganic Chemistry ( IF 4.6 ) Pub Date : 2021-10-06 , DOI: 10.1021/acs.inorgchem.1c01681
Weiwei Li 1 , Pei Wang 1, 2 , Chao Xu 3 , Hu Tang 1 , Peng Ren 1 , Zhiqing Xie 1 , Xuefeng Zhou 2 , Jian Chen 2 , Shanmin Wang 1, 2 , Songbai Han 1 , Yusheng Zhao 1, 2 , Liping Wang 1
Affiliation  

High-quality hafnium disilicide (HfSi2) has been successfully synthesized using a high-pressure and high-temperature (HPHT) method at 3 GPa and 1573 K in a DS6 × 10 MN cubic press. The modest synthesis temperature is aided by significant decreases in both liquidus and solidus temperatures at high pressure for the Si-rich portion of the Hf–Si binary system. The in situ high-pressure X-ray diffraction study yielded a bulk modulus of B0 = 124.4 ± 0.8 GPa with a fixed B0 = 4.0 for HfSi2, which exhibits a dramatically anisotropic compressibility, with a and c axes nearly twice as incompressible as the b axis. The bulk HfSi2 as synthesized has a Vickers hardness of 6.9 ± 0.1 GPa and high thermal stability of 1163 K in air, indicating its hard and refractory ceramic properties. The core-level XPS data of Hf 4f and Si 2p have been collected on the bulk samples of HfSi2, HfSi, and Hf, as well as Si powder to examine the Hf–Si bonding in hafnium silicides. The Hf 4f7/2 binding energies are 15.0 and 14.8 eV for bulk HfSi2 and HfSi, respectively.

中文翻译:

HfSi2的高压高温合成及原位高压同步辐射X射线衍射研究

使用高压高温 (HPHT) 方法在 3 GPa 和 1573 K 条件下,在 DS6 × 10 MN 立方压机中成功合成了高质量的二硅化铪 (HfSi 2 )。对于 Hf-Si 二元体系的富硅部分,高压下液相线和固相线温度的显着降低有助于适度的合成温度。原位高压X射线衍射研究,得到的体积弹性模量0 = 124.4±0.8 GPA具有固定0 ' = 4.0 HfSi 2,其表现出显着的各向异性可压缩性,与一个ç轴近两倍不可压缩为b轴。散装 HfSi合成后的2具有 6.9 ± 0.1 GPa 的维氏硬度和在空气中 1163 K 的高热稳定性,表明其具有坚硬和耐火的陶瓷特性。Hf 4f 和 Si 2p 的核心级 XPS 数据已在 HfSi 2、HfSi 和 Hf 以及 Si 粉末的大块样品上收集,以检查铪硅化物中的 Hf-Si 键合。Hf 4f 7/2结合能对于块状 HfSi 2和 HfSi 分别为 15.0 和 14.8 eV 。
更新日期:2021-10-18
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