Russian Electrical Engineering Pub Date : 2021-09-21 , DOI: 10.3103/s1068371221070026 S. V. Anikuev 1 , E. I. Kostyukova 1 , G. V. Nikitenko 1 , I. K. Sharipov 1
Abstract
A theoretical justification of the design solutions for several additional functions of an apparatus for testing power semiconductors is proposed. These functions are the electromagnetic compatibility check of the apparatus’s parts, the passage of impact current through the device, and the provision of test safety. The occurrence pattern of conducted interferences in the test system and the minimization of the periodic voltage component by packet modulation are evaluated. Potential negative effects of the test control of power semiconductors are noted. The test safety evaluation is carried out considering several important factors, such as the pulselike essence of impact current and voltage and their short duration. Packet modulation is recommended for limiting the number of sine-wave voltage periods.
中文翻译:
功率半导体脉冲电流测试设备附加功能的实现
摘要
提出了用于测试功率半导体的设备的几个附加功能的设计解决方案的理论依据。这些功能是设备部件的电磁兼容性检查、冲击电流通过设备以及提供测试安全性。评估测试系统中传导干扰的发生模式和通过数据包调制使周期性电压分量最小化。注意到功率半导体测试控制的潜在负面影响。测试安全性评估考虑了几个重要因素,如冲击电流和电压的脉冲本质及其持续时间短。建议使用数据包调制来限制正弦波电压周期的数量。