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An improved semi-empirical procedure for Compton scattering technique applied to measure pipeline thickness
Journal of Radioanalytical and Nuclear Chemistry ( IF 1.6 ) Pub Date : 2021-09-18 , DOI: 10.1007/s10967-021-07995-3
Vo Hoang Nguyen 1, 2 , Nguyen Huu Bao 1, 2 , Nguyen Duy Thong 1, 2 , Tran Thien Thanh 1, 2, 3 , Chau Van Tao 1, 2, 3 , Huynh Dinh Chuong 2, 3
Affiliation  

This study aims to formulate semi-empirical processing applied to analyze simulated and experimental scattering spectra on pipeline samples for estimating the intensity of the single scattering component for the Compton scattering technique. Firstly, a procedure has been developed based on probability density functions of each scattering component, which are obtained by GEANT4. Secondly, sixteen targets are simulated with MCNP6 to validate the proposed procedure. It is shown that the relative deviation for all samples is under 3%. Thirdly, the nine calculated thickness of pipeline samples is determined with a maximum relative deviation lower than 5% in comparing to calibration thickness.



中文翻译:

一种改进的康普顿散射技术半经验程序用于测量管道厚度

本研究旨在制定半经验处理方法,用于分析管道样品的模拟和实验散射光谱,以估计康普顿散射技术的单个散射分量的强度。首先,基于每个散射分量的概率密度函数开发了一个程序,这些函数是由 GEANT4 获得的。其次,使用 MCNP6 模拟了 16 个目标以验证所提出的程序。结果表明,所有样品的相对偏差都在 3% 以下。第三,管道样品的九个计算厚度与校准厚度相比最大相对偏差低于5%。

更新日期:2021-09-19
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