The effect of multifilament coated conductors on reducing shielding currents was studied by numerical electromagnetic field analyses. We compared the behaviours of the shielding currents in stacked double pancake coils and layer-wound solenoid coils (SLCs) wound with the following conductors: a monofilament coated conductor, a copper-plated two-filament coated conductor, and an insulated two-filament coated conductor. Shielding-current-induced fields (SCIFs) in the layer-wound SLCs wound with copper-plated two-filament coated conductors decay more rapidly than in stacked double pancake coils wound with copper-plated two-filament coated conductors. In addition, we examined the behaviour of the shielding currents in the coils with and without normal metal terminals. The normal metal terminals made the decay time constants of the SCIFs in pancake coils longer, while the decay time constants of SCIFs did not change notably in the layer-wound SLCs with and without normal metal terminals.

通过数值电磁场分析研究了复丝涂层导体对降低屏蔽电流的影响。我们比较了用以下导体缠绕的堆叠双煎饼线圈和层绕螺线管线圈 (SLC) 中屏蔽电流的行为：单丝涂层导体、镀铜两丝涂层导体和绝缘两丝涂层导体导体。与用镀铜两线涂层导体缠绕的堆叠双薄饼线圈相比，用镀铜两线涂层导体缠绕的层绕 SLC 中的屏蔽电流感应场 (SCIF) 衰减得更快。此外，我们检查了带有和不带有普通金属端子的线圈中屏蔽电流的行为。