This paper reports on absorption properties of thin films of hydrogenated amorphous and microcrystalline silicon considered for absorption-based applications, such as solar cell, photodetectors, filters, sensors, etc. A series of four amorphous and four microcrystalline samples PECVD deposited under varied hydrogen dilution was under consideration. Various absorption metrics, based separately on the absorption coefficient and the refractive index (single pass absorption, optical path length, classical light trapping limit) or direct absorptance calculated by the Yablonovitch concept based on a mutual role of them were examined and compared. Differences in absorption abilities are related to the evolving thin film microstructure.

中文翻译：

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Si:H 薄膜中的光吸收：重新审视折射率和吸收系数的作用

本文报告了考虑用于基于吸收的应用的氢化非晶和微晶硅薄膜的吸收特性，例如太阳能电池、光电探测器、过滤器、传感器等。 在不同的氢稀释度下沉积的一系列四个非晶和四个微晶样品 PECVD正在考虑中。检查和比较了各种吸收指标，分别基于吸收系数和折射率（单程吸收、光路长度、经典光捕获极限）或由 Yablonovitch 概念计算的直接吸收率，基于它们的相互作用。吸收能力的差异与不断发展的薄膜微结构有关。