During re-evaluation of the data presented in this article, the authors noticed an error in Figure S1 b (in the Supporting Information), where the incorrect XRD pattern of NiMoO₄ nanoflakes was provided. The correct XRD pattern (which corresponds to JCPDS card no. 45-0142) is shown in Figure 1 a and the corresponding SEM image is shown in Figure 1 b. This error arose as in rare cases NiMoO₄ that gives an XRD pattern corresponding to 86-0362 is formed by structural conversion during the calcination process. However, under optimized experimental conditions only NiMoO₄ that gives the 45-0142 pattern is formed. The spacing of adjacent lattice fringes of 0.24 nm therefore match the d value of the (400) crystal plane of NiMoO₄ and not the (002) value, as given in Figure 5 d (the corrected image is given in Figure 2). The corrected Figure 2 b with the 86-0362 pattern replaced with 45-0142 is given in Figure 3. The authors apologize for this oversight and confirm that the conclusions are unchanged.

在重新评估本文提供的数据期间，作者注意到图 S1 b（在支持信息中）中的错误，其中提供了不正确的 NiMoO ₄纳米薄片的 XRD 图案。正确的 XRD 图案（对应于 JCPDS 卡号 45-0142）如图 1a 所示，相应的 SEM 图像如图 1b 所示。出现这种错误是因为在极少数情况下，提供对应于 86-0362 的 XRD 图案的NiMoO ₄是在煅烧过程中通过结构转换形成的。然而，在优化的实验条件下，仅形成了提供 45-0142 图案的NiMoO ₄。因此，0.24 nm 的相邻晶格条纹的间距与 NiMoO ₄的 (400) 晶面的d值匹配而不是 (002) 值，如图 5 d 所示（校正后的图像在图 2 中给出）。图 3 中给出了用 45-0142 替换 86-0362 模式的更正图 2b。作者为这一疏忽道歉，并确认结论没有改变。