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Impact of radiation-induced soft error on embedded cryptography algorithms
Microelectronics Reliability ( IF 1.6 ) Pub Date : 2021-09-02 , DOI: 10.1016/j.microrel.2021.114349
Vitor Bandeira 1 , Jack Sampford 2 , Rafael Garibotti 3 , Matheus Garay Trindade 4 , Rodrigo Possamai Bastos 4 , Ricardo Reis 1 , Luciano Ost 5
Affiliation  

With the advance of autonomous systems, security is becoming the most crucial feature in different domains, highlighting the need for protection against potential attacks. Mitigation of these types of attacks can be achieved using embedded cryptography algorithms, which differ in performance, area, and reliability. This paper compares hardware implementations of the eXtended Tiny Encryption Algorithm (XTEA) and the Advanced Encryption Standard (AES) algorithms. Results show that the XTEA implementation gives the best relative performance (e.g., throughput, power), area, and soft error reliability trade-offs.



中文翻译:

辐射引起的软错误对嵌入式密码算法的影响

随着自治系统的进步,安全性正成为不同领域中最重要的特征,突出了防范潜在攻击的必要性。可以使用性能、面积和可靠性不同的嵌入式加密算法来缓解这些类型的攻击。本文比较了扩展微型加密算法 (XTEA) 和高级加密标准 (AES) 算法的硬件实现。结果表明,XTEA 实现提供了最佳的相对性能(例如,吞吐量、功率)、面积和软错误可靠性权衡。

更新日期:2021-09-02
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