An effective method for studying the relationship of dielectric functions and thickness in perovskite SrRuO₃ (SRO) thin film was proposed by spectroscopic ellipsometry measurement. A wedge-shaped SRO film with various thickness was prepared on SrTiO₃ substrate by pulse laser deposition, whose dielectric functions and thickness were obtained by using the Drude–Lorentz dispersive model. The acquired band gap is slightly enhanced with film thickness reducing due to the one-dimensional quantum confinement effect and the disorder effect. The proposed method is expected to be applied for dielectric modulation in perovskite photonic device.

中文翻译：

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钙钛矿 SrRuO3 薄膜的介电函数和带隙调制

提出了一种通过椭偏光谱测量研究钙钛矿SrRuO ₃ (SRO)薄膜介电函数与厚度关系的有效方法。通过脉冲激光沉积在SrTiO ₃衬底上制备了不同厚度的楔形SRO薄膜，其介电函数和厚度通过Drude-Lorentz色散模型获得。由于一维量子限制效应和无序效应，获得的带隙随着薄膜厚度的减小而略微增加。该方法有望应用于钙钛矿光子器件中的介电调制。