Abstract

A new version of the reflecting interferometer for \(S\)-polarized light consisting of a thin metal film placed in front of a multilayer dielectric interferometer is considered. The appearance of narrow extremes in the spectral or angular dependence of the reflection coefficient depends on the location of the metal film in the node or antinode of the standing wave reflected from the interferometer (maxima or minima).

中文翻译：

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偏振光反射干涉仪光学特性的转化

摘要

考虑了用于\(S\)偏振光的反射干涉仪的新版本，该反射干涉仪由放置在多层介电干涉仪前面的金属薄膜组成。反射系数的光谱或角度相关性中窄极端的出现取决于金属膜在从干涉仪反射的驻波（最大值或最小值）的节点或波腹中的位置。