Characterization of carbon structure was studied through deposition of carbon films on three different substrates at various angular positions. The thin films were prepared by a low energy plasma focus device and placed on graphite, aluminum, and magnesium substrates. The deposition process performed in presence of an active, as well as a noble gas, namely nitrogen and argon. The synthesis of thin films deposited at lower angular position shows nano-crystalline graphite and amorphous carbon structures. A carbon crystal has been detected for deposition at higher angular positions. The characterization of the crystal was investigated and it was revealed that the deposited thin film has hexagonal crystal structure. Further study of crystal led to the conclusion that it can be categorized under crystalline aromatic network. The surface of all synthesized films containing crystalline aromatic network was yellowish orange color (golden). The characterization of each structure was verified by x-ray diffraction (XRD), Raman spectroscopy, field emission scanning electron microscopy (FESEM), nano-indentation, Fourier transform infrared spectroscopy (FTIR), and transmission electron microscopy (TEM) analyses. Raman spectroscopy was used as a base analysis to classify carbon structures. Raman parameters of natural graphite structure, such as G peak position and I_D/I_G ratio, as well as, those of carbon crystal, nano-crystalline graphite, and amorphous carbon were identified.

通过在不同角度位置的三种不同基材上沉积碳膜来研究碳结构的表征。薄膜由低能等离子体聚焦装置制备并放置在石墨、铝和镁基板上。沉积过程在活性气体以及惰性气体（即氮气和氩气）的存在下进行。在较低角位置沉积的薄膜的合成显示出纳米晶石墨和无定形碳结构。已检测到碳晶体沉积在更高的角位置。对晶体的表征进行了研究，发现沉积的薄膜具有六方晶体结构。对晶体的进一步研究得出结论，它可以归类为结晶芳香网络。所有含有结晶芳香网络的合成薄膜的表面都是黄橙色（金黄色）。每个结构的表征通过 X 射线衍射 (XRD)、拉曼光谱、场发射扫描电子显微镜 (FESEM)、纳米压痕、傅里叶变换红外光谱 (FTIR) 和透射电子显微镜 (TEM) 分析进行验证。拉曼光谱被用作基础分析以对碳结构进行分类。天然石墨结构的拉曼参数，如 G 峰位置和 I 和透射电子显微镜 (TEM) 分析。拉曼光谱被用作基础分析以对碳结构进行分类。天然石墨结构的拉曼参数，如 G 峰位置和 I 和透射电子显微镜 (TEM) 分析。拉曼光谱被用作基础分析以对碳结构进行分类。天然石墨结构的拉曼参数，如 G 峰位置和 I_D /I _G比值，以及碳晶体、纳米晶石墨和无定形碳的比值被确定。