The Keck Planet Imager and Characterizer (KPIC) is a purpose-built instrument to demonstrate technological and instrumental concepts initially developed for the exoplanet direct imaging field. Located downstream of the current Keck II adaptive optic (AO) system, KPIC contains a fiber injection unit (FIU) capable of combining the high-contrast imaging capability of the AOs system with the high dispersion spectroscopy capability of the current Keck high resolution infrared spectrograph (NIRSPEC). Deployed at Keck in September 2018, this instrument has already been used to acquire high-resolution spectra (R > 30,000) of multiple targets of interest. In the near term, it will be used to spectrally characterize known directly imaged exoplanets and low-mass brown dwarf companions visible in the northern hemisphere with a spectral resolution high enough to enable spin and planetary radial velocity measurements as well as Doppler imaging of atmospheric weather phenomena. Here, we present the design of the FIU, the unique calibration procedures needed to operate a single-mode fiber instrument and the system performance.

中文翻译：

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Keck Planet Imager and Characterizer：用于高分辨率系外行星光谱的专用单模光纤注入单元

Keck Planet Imager and Characterizer (KPIC) 是一种专用仪器，用于展示最初为系外行星直接成像领域开发的技术和仪器概念。KPIC 位于当前 Keck II 自适应光学 (AO) 系统的下游，包含一个光纤注入单元 (FIU)，能够将 AOs 系统的高对比度成像能力与当前 Keck 高分辨率红外光谱仪的高色散光谱能力相结合（美国国家标准委员会）。该仪器于 2018 年 9 月在凯克部署，已用于获取多个感兴趣目标的高分辨率光谱 (R > 30,000)。近期内，它将用于对北半球可见的已知直接成像系外行星和低质量褐矮星伴星进行光谱表征，其光谱分辨率足够高，以实现自旋和行星径向速度测量以及大气天气现象的多普勒成像。在这里，我们介绍了 FIU 的设计、操作单模光纤仪器所需的独特校准程序以及系统性能。