Transmission electron microscopy (TEM) has been used in the characterizations of the lattice and defect structures as well as electronic and chemical properties of various materials. When TEM analyses were performed on lead halide perovskites (LHPs) and related materials, it has often been found that transformation and damage were easily induced in the specimens by electron beam irradiation. As the structural and chemical instabilities of LHPs and related materials are the main obstacle that must be overcome for their practical large-scale applications in solar cells and other optoelectronic applications, we examine whether and how the TEM-based irradiation and analyses can serve the purpose of rapid evaluation of the instabilities of a LHP to stimuli such as light and electric field which are crucial to its optoelectronic applications. We first provide a brief overview of the basic physical properties of LHPs related to the instability and the current understanding of the general mechanisms of sample damages induced by energetic electrons, followed with an analysis of the distinctive vulnerability and damaging features of LHPs with respect to electron beam irradiation. Based on the analysis of the similarities in the mechanisms of the damages generated by different stimuli, proper conditions are outlined with which the TEM-based investigations can be employed as a speed-up tester for the instabilities of LHPs against photon (including visible, ultraviolet and x-ray) exposure and an applied electric field. Furthermore, the perspectives of employing TEM-based processes in the fabrication of nanostructures and directly carrying out subsequent in situ analysis are elaborated, which is key to acquiring knowledge for improving focused electron beam-based industrial micro- and nanofabrication technologies.

透射电子显微镜 (TEM) 已用于表征各种材料的晶格和缺陷结构以及电子和化学性质。当对卤化铅钙钛矿 (LHP) 和相关材料进行 TEM 分析时，经常发现电子束照射很容易在样品中引起转变和损坏。由于 LHP 和相关材料的结构和化学不稳定性是它们在太阳能电池和其他光电应用中的实际大规模应用必须克服的主要障碍，我们研究了基于 TEM 的辐照和分析是否以及如何达到目的快速评估 LHP 对光和电场等刺激的不稳定性，这对其光电应用至关重要。我们首先简要概述了 LHP 与不稳定性相关的基本物理特性以及目前对高能电子引起的样品损伤的一般机制的理解，然后分析了 LHP 相对于电子的独特脆弱性和损伤特征。光束照射。在分析不同刺激产生的损伤机制的相似性的基础上，概述了适当的条件，在这些条件下，基于 TEM 的研究可以作为 LHPs 对光子（包括可见光、紫外线）不稳定性的加速测试器。和 X 射线）曝光和外加电场。此外，在纳米结构制造中采用基于 TEM 的工艺并直接进行后续加工的前景详细阐述了原位分析，这是获得改进基于聚焦电子束的工业微纳米制造技术的知识的关键。