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Internal surface roughness measurement of metal additively manufactured samples via x-ray CT: the influence of surrounding material thickness
Surface Topography: Metrology and Properties ( IF 2.7 ) Pub Date : 2021-07-09 , DOI: 10.1088/2051-672x/ac0e7c
Joseph John Lifton 1 , Yuchan Liu 2 , Zheng Jie Tan 1 , Bisma Mutiargo 1 , Xue Qi Goh 3 , Andrew Alexander Malcolm 1
Affiliation  

X-ray computed tomography (XCT) can be used to measure the internal and external surfaces of an object non-destructively and with micron-level spatial resolution. XCT is therefore an appealing method for measuring and characterising the internal surface roughness of additively manufactured parts that cannot be accessed by traditional tactile and optical surface roughness instruments. In this work, an additively manufactured aluminium spherical surface roughness sample is designed, fabricated and its surface roughness measured via a focus variation microscope, the sample is then XCT scanned when embedded in varying thicknesses of surrounding material. A quantitative and qualitative comparison between the optical and XCT surface roughness measurements is made; the results show that the Sa of the XCT-based surface roughness measurements increases as a function of surrounding material thickness.



中文翻译:

通过 X 射线 CT 测量金属增材制造样品的内表面粗糙度:周围材料厚度的影响

X 射线计算机断层扫描 (XCT) 可用于非破坏性地以微米级空间分辨率测量物体的内表面和外表面。因此,XCT 是一种有吸引力的方法,用于测量和表征增材制造零件的内部表面粗糙度,而传统的触觉和光学表面粗糙度仪器无法测量这些零件的内部表面粗糙度。在这项工作中,设计、制造了增材制造的铝球形表面粗糙度样品,并通过焦距变化显微镜测量其表面粗糙度,然后将样品嵌入不同厚度的周围材料中时进行 XCT 扫描。对光学和 XCT 表面粗糙度测量进行了定量和定性比较;结果表明,Sa 基于 XCT 的表面粗糙度测量值随着周围材料厚度的增加而增加。

更新日期:2021-07-09
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