An alternative approach to image simulation in high resolution transmission electron microscopy (HRTEM) is introduced after a comparative analysis of the existing image simulation methods. The alternative method is based on considering the atom center as an electrostatic interferometer akin to the conventional off-axis electron biprism within few nanometers of focus variation. Simulation results are compared with the experimental images of 2D materials of MoS₂, BN recorded under the optimum combination of third order spherical aberration μm and defocus 1, 4, and 8 nm and are found to be in good agreement.

中文翻译：

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考虑原子作为静电干涉仪的高分辨率透射电子显微镜图像模拟

在对现有图像模拟方法进行比较分析后，介绍了高分辨率透射电子显微镜 (HRTEM) 中图像模拟的替代方法。另一种方法是基于将原子中心视为一个静电干涉仪，类似于传统的离轴电子双棱镜在几纳米的焦点变化范围内。将模拟结果与在三阶球差μ m 和离焦1、4 和 8 nm的最佳组合下记录的 MoS ₂、BN 2D 材料的实验图像进行比较，发现具有良好的一致性。