X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) measurements are used for investigating incorporation of iodine and tin into the stibnite (Sb₂S₃) lattice, as well as for determining surface composition and structure, respectively. The XRD analysis revealed the visible presence of a single phase, that of pure orthorhombic Sb₂S₃ structure. XPS survey spectra confirmed the presence of expected elements (Sb, S, Sn and I) at the surface of corresponding samples. Since the bonding identification was hindered by non-uniform charging of samples during acquiring the photoelectron spectra, a novel approach for the analysis of high resolution spectra was proposed and successfully implemented. XPS results showed that surface composition of the non-doped sample coincides with that of the bulk, while doping strongly affects surface of the samples. Sn-doped sample appears to be prone to surface oxidation. The presence of Sb₂S₃, Sb₂O₃, SnS₂ and Sn(0) phases at the surface was revealed. Strong segregation of antimony was observed in the I-doped Sb₂S₃ sample. Iodine is also present at the surface in the form of the SbI₃ phase, while the detected sulphur signal most probably corresponds to S atoms from unaltered deeper layers.

X 射线衍射 (XRD) 和 X 射线光电子能谱 (XPS) 测量分别用于研究碘和锡掺入辉锑矿 (Sb ₂ S ₃ ) 晶格的情况，以及确定表面组成和结构。XRD 分析表明存在可见的单相，即纯斜方晶系 Sb ₂ S ₃结构体。XPS 调查光谱证实了相应样品表面存在预期元素（Sb、S、Sn 和 I）。由于在获取光电子光谱期间样品的不均匀充电阻碍了键合识别，因此提出并成功实施了一种用于分析高分辨率光谱的新方法。XPS 结果表明，未掺杂样品的表面组成与体相一致，而掺杂对样品的表面影响很大。Sn 掺杂的样品似乎易于表面氧化。Sb ₂ S ₃、Sb ₂ O ₃、SnS _{2 的存在}和表面的 Sn(0) 相被揭示。在 I 掺杂的 Sb ₂ S ₃样品中观察到锑的强烈偏析。碘也以 SbI ₃相的形式存在于表面，而检测到的硫信号最有可能对应于来自未改变的更深层的 S 原子。