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70-110 GHz On-wafer Probe Station S-parameters Measurements of Planar Multenna
Radioelectronics and Communications Systems Pub Date : 2021-08-02 , DOI: 10.3103/s0735272721060029
Oleksandr Sushko 1, 2 , Max Munoz Torrico 1 , Robert S. Donnan 1 , Clive G. Parini 1 , Rostyslav Dubrovka 1
Affiliation  

Abstract

This paper presents S11 measurements of a flat, slotted, sub-mm sized antenna, integrated with a Schottky diode; the overall structure being termed a ‘multenna’ in description of its action to radiate a signal beam field that is a higher order harmonic of the signal beam field it receives. The multenna is constituted of two square slots; one tuned to receive at the frequency of 100 GHz and the other to radiate at 300 GHz. The S11 readings are acquired using a cascade probe station driven by a Vector Network Analyzer (VNA). The investigated frequency domain of this study is 70–110 GHz (WR-10 waveguide band). Simulation results agree in key features with measurements over the band, thereby verifying the measurement procedure and validating the use of a lumped-element approach to represent the diode impedance.



中文翻译:

70-110 GHz 晶圆上探针台平面多天线的 S 参数测量

摘要

本文介绍了与肖特基二极管集成的扁平、开槽、亚毫米尺寸天线的S 11测量值;整个结构被称为“多天线”,以描述其辐射信号波束场的作用,该信号波束场是其接收到的信号波束场的高次谐波。多天线由两个方槽组成;一个调谐到以 100 GHz 的频率接收,另一个以 300 GHz 的频率辐射。在小号11读数是使用由矢量网络分析仪 (VNA) 驱动的级联探针台获取的。本研究调查的频域为 70–110 GHz(WR-10 波导频带)。仿真结果在关键特性上与频带上的测量一致,从而验证了测量程序并验证了使用集总元件方法来表示二极管阻抗的情况。

更新日期:2021-08-03
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