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Continuous network structure of two-dimensional silica across a supporting metal step edge: An atomic scale study
Physical Review Materials ( IF 3.4 ) Pub Date : 2021-07-29 , DOI: 10.1103/physrevmaterials.5.l071001
Leonard Gura 1 , Sergio Tosoni 2 , Adrián Leandro Lewandowski 1 , Patrik Marschalik 1 , Zechao Yang 1 , Wolf-Dieter Schneider 1 , Markus Heyde 1 , Gianfranco Pacchioni 2 , Hans-Joachim Freund 1
Affiliation  

The network structure of a silica bilayer film at a monolayer-bilayer transition and across a supporting metal step edge was studied at the atomic scale by scanning tunneling microscopy. The ring size distribution, ring-ring distances, and height profiles are analyzed across the step edge region. Density functional theory proposes two models to explain the observed network structure: a pinning of the lower layer to the substrate and a carpetlike mode. The results indicate a continuous coverage of the silica bilayer film across the step edge.

中文翻译:

跨越支撑金属台阶边缘的二维二氧化硅的连续网络结构:原子尺度研究

通过扫描隧道显微镜在原子尺度上研究了单层-双层过渡处和支撑金属台阶边缘的二氧化硅双层膜的网络结构。跨台阶边缘区域分析环尺寸分布、环-环距离和高度轮廓。密度泛函理论提出了两个模型来解释观察到的网络结构:下层固定到基材和地毯状模式。结果表明二氧化硅双层膜跨越台阶边缘连续覆盖。
更新日期:2021-07-29
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