HTS stack has high current carrying capacity which is widely used in motors or generators. Usually, the HTS tapes are stacked and soldered together at ends. Although the HTS tapes are insulated and have low loss, the soldering parts are conventional conductors with resistance. When the HTS stack is subject to a parallel ac magnetic field, the coupling currents are induced because of the soldered parts which would form current loops. And then, the coupling currents would cause coupling loss or been called resistance loss. The loss is not only related to the applied field but also depends on the number of tapes and resistance value. The minimum electromagnetic entropy production method is used to study the dependence of resistance and number of tapes on the magnetization loss systematically. A HTS stack with realistic resistance was prepared and measured to be verified the calculation. The results show that the superconductor loss increases at the beginning but then decreases later when more tapes are stacked. However, the resistance loss increases almost linearly. The resistance loss and the superconductor loss also depend on the resistance value. When the resistance is small, although there are coupling currents pass through the ending parts, the resistance value is so small that the resistance loss is very difficult to be observed. And the resistance loss would increase with the resistance linearly and the superconductor loss almost keeps constant. With the resistance increasing, there is a peak in the resistance loss and the superconductor loss drops dramatically. Later, the resistance loss decreases with the resistance and the superconductor loss keeps constant again, because the resistance is so large that no coupling current can pass through the soldering parts so that there is almost no resistance at all.

中文翻译：

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电阻和带数对焊接 REBCO 堆叠耦合交流损耗的依赖性

HTS电堆具有很高的载流能力，广泛用于电动机或发电机。通常，HTS 胶带在末端堆叠并焊接在一起。虽然 HTS 胶带是绝缘的且损耗低，但焊接部分是具有电阻的常规导体。当高温超导堆栈受到平行交流磁场的影响时，由于焊接部件会形成电流回路，因此会感应出耦合电流。然后，耦合电流会引起耦合损耗或称为电阻损耗。损耗不仅与施加的场有关，还取决于胶带的数量和电阻值。采用最小电磁熵产生法系统地研究了电阻和带数对磁化损耗的依赖性。准备并测量了具有实际电阻的 HTS 堆栈以验证计算。结果表明，超导体损耗在开始时增加，但在堆叠更多带时随后减少。然而，电阻损耗几乎呈线性增加。电阻损耗和超导体损耗也取决于电阻值。当电阻较小时，虽然有耦合电流通过端部，但电阻值很小，很难观察到电阻损耗。并且电阻损耗随电阻线性增加，超导体损耗几乎保持不变。随着电阻的增加，电阻损耗出现峰值，超导体损耗急剧下降。之后，