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Current Pulse Switches on the Basis of Reverse Switch-on Dynistors for Power Electrophysical Equipment
Instruments and Experimental Techniques ( IF 0.6 ) Pub Date : 2021-07-27 , DOI: 10.1134/s0020441221040138
A. G. Arzev 1 , I. V. Galakhov 1 , L. S. Ganin 1 , E. V. Kozhenkov 1 , A. V. Krekov 1 , V. A. Osin 1 , V. V. Sviridov 1 , A. V. Grishanin 2 , V. V. Eliseev 2 , V. N. Kartaev 2 , V. A. Martynenko 2 , V. G. Muskatn’ev 2 , D. A. Naumov 2 , D. Yu. Nemaev 2 , O. V. Frolov 2 , A. A. Khapugin 2
Affiliation  

Abstract

The results of the development and the main characteristics of a new generation of semiconductor current switches (250 kA/25 kV/70 C) based on assemblies of series-connected reverse switched-on dynistors (RSDs) are presented. The methods for increasing the switched power and increasing the service life and reliability of RSD switches with maintenance of the previously accepted weight and size indicators were studied. The problem was solved by reducing the RSD power loss and increasing the resistance of the contact connections to the effects of high-power current pulses. The switch design was modernized and the silicon structure was optimized; a new technology for low-temperature connections in the silicon–metal system with the use of silver was developed, thus making it possible to double the active contact area and improve the load characteristics and service life of the new switches. The operating and maximum permissible values of the starting and switched currents were determined. The results of the operation of RSD switches in capacitive energy-storage devices of high-power laser devices are presented. Based on the results of life tests, the service life of new devices was assessed.



中文翻译:

电力电物理设备基于反向导通的电流脉冲开关

摘要

介绍了基于串联反向导通电阻器 (RSD) 组件的新一代半导体电流开关 (250 kA/25 kV/70 C) 的开发结果和主要特性。研究了在保持先前公认的重量和尺寸指标的情况下增加开关功率和增加 RSD 开关的使用寿命和可靠性的方法。该问题通过降低 RSD 功率损耗和增加接触连接对高功率电流脉冲影响的电阻来解决。开关设计现代化,硅结构优化;开发了一种使用银在硅-金属系统中进行低温连接的新技术,从而使有效接触面积加倍并提高新型开关的负载特性和使用寿命成为可能。确定了启动电流和开关电流的工作和最大允许值。介绍了高功率激光装置的电容式储能装置中 RSD 开关的操作结果。根据寿命测试结果,对新设备的使用寿命进行评估。

更新日期:2021-07-27
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