The dynamics and dispersion of surface phonons in heterostructure semiconductor/ topological insulator Si/Bi₂Te₃ was investigated using high resolution Brillouin light scattering method in the GHz frequency range. Both Rayleigh and Sezawa surface acoustic waves have been observed for wave vectors ranging from 0.006 to 0.023 nm⁻¹. Anomaly in dispersion relations ω(q) for both surface waves were detected for the wave vector q = 0.016 nm⁻¹. The finite element method (FEM) was used to simulate the observed shapes of ω(q) and to find the deformation profiles of surface acoustic waves. We attribute the observed changes to the coupling between low energy electrons and surface phonons. The coupling between helical Dirac states and surface phonons is discussed in the frame of accessible theoretical models.

使用高分辨率布里渊光散射方法在 GHz 频率范围内研究了异质结构半导体/拓扑绝缘体 Si/Bi ₂ Te ₃中表面声子的动力学和色散。对于范围从 0.006 到 0.023 nm ^{-1 的}波矢量，已经观察到瑞利和 Sezawa 表面声波。对于波矢量q  = 0.016 nm ^-1检测到两个表面波的色散关系ω ( q ) 的异常。有限元法 (FEM) 用于模拟观察到的ω ( q) 并找到表面声波的变形轮廓。我们将观察到的变化归因于低能电子和表面声子之间的耦合。螺旋狄拉克态和表面声子之间的耦合在可访问的理论模型框架中进行了讨论。