Among cyanide tailings, chalcopyrite is one of the main minerals. However, little study is available regarding the flotation behavior and mechanism of cyanide chalcopyrite, especially the influence of cyanide leaching time on the physical and chemical properties of chalcopyrite surface. In this work, the cyanide adsorption mechanism of the chalcopyrite surface over time and its response to flotation was probed for the first using contact angle, zeta potential, microflotation, X − ray photoelectron spectroscopy (XPS) and time−of−flight secondary ion mass spectrometry (ToF−SIMS). The results of contact angle showed that the surface hydrophobicity of the chalcopyrite surface decreased with increasing cyanidation time, thus preventing the adsorption of xanthate, which was confirmed by zeta potential and microflotation. XPS analysis indicated that with the gradual progress of cyanidation, hydrophilic CN⁻, CNO⁻, SO₄²⁻ and CuCN⁻ were formed on the surface of chalcopyrite. ToF−SIMS investigated the distribution of anion species on the surface of chalcopyrite, showing that with the increasing cyanidation time, more cyanide species formed on the surface of mineral layer, and gradually diffuse from the mineral surface to the bulk phase, finally forming a film with depth of about 20 nm. Thus, the chalcopyrite hydrophobicity was depressed.

在氰化物尾矿中，黄铜矿是主要矿物之一。然而，关于氰化物黄铜矿的浮选行为和机理，尤其是氰化物浸出时间对黄铜矿表面理化性质的影响，目前鲜有研究。在这项工作中，首次使用接触角、zeta 电位、微浮选、X 射线光电子能谱 (XPS) 和飞行时间二次离子质量探测了黄铜矿表面随时间的氰化物吸附机制及其对浮选的响应光谱（ToF-SIMS）。接触角结果表明，黄铜矿表面的疏水性随着氰化时间的增加而降低，从而阻止了黄药的吸附，zeta电位和微浮选证实了这一点。^-、CNO ^-、SO ₄ ^2-和CuCN ^-在黄铜矿表面形成。ToF-SIMS 研究了黄铜矿表面阴离子物种的分布，表明随着氰化时间的增加，更多的氰化物在矿物层表面形成，并逐渐从矿物表面扩散到体相，最终形成薄膜深度约为 20 nm。因此，黄铜矿疏水性被抑制。