Substructures of LiF crystal samples grown by the Kyropoulos and Bridgman–Stockbarger methods were studied. Measurements were made using the double-crystal x-ray diffractometry technique. The angular full width at half maximum (FWHM) of peaks was calculated for each diffraction pattern. Statistical processing of the measured FWHM indicated that samples grown by the Bridgman–Stockbarger method had smaller angular misorientation of the substructure and included areas suitable for manufacturing crystalline x-ray analyzer blanks of the required size.

中文翻译：

---

LiF单晶的缺陷结构

研究了通过 Kyropoulos 和 Bridgman-Stockbarger 方法生长的 LiF 晶体样品的亚结构。使用双晶 X 射线衍射技术进行测量。计算每个衍射图的峰的半峰角全宽 (FWHM)。测量的 FWHM 的统计处理表明，通过 Bridgman-Stockbarger 方法生长的样品具有较小的子结构角度错误，并且包括适合制造所需尺寸的晶体 X 射线分析仪坯料的区域。