ABSTRACT

This study analysed the electronic structures of dislocations in 9Cr steel using a spherical aberration-corrected scanning transmission electron microscope equipped with a monochromated electron energy-loss spectroscope. This is the first study to report that dislocations broaden a zero-loss peak (ZLP) and also induce an absorption phenomenon at approximately 0.5 eV in the ZLP tail, which are interpreted to be related to phonon scatterings by dislocations and interference effect of multiple beams, respectively. This work also experimentally demonstrates that the use of a spectrum-imaging method allows imaging of dislocations through ZLP broadening. The approach proposed herein is a promising technique for detecting dislocations in high Cr steel.

摘要

本研究使用配备单色电子能量损失光谱仪的球差校正扫描透射电子显微镜分析了 9Cr 钢中位错的电子结构。这是第一个报告位错加宽零损耗峰 (ZLP) 并在 ZLP 尾部约 0.5 eV 处引起吸收现象的研究，这被解释为与位错和多光束干涉效应引起的声子散射有关， 分别。这项工作还通过实验证明，使用光谱成像方法可以通过 ZLP 加宽对位错进行成像。本文提出的方法是一种很有前途的技术，用于检测高铬钢中的位错。