Thermally evaporated zinc-cadmium selenide (Cd_xZn_1-xSe) thin films with different Cd-concentration (0.0$\le x\le 1.0,$ at%) have been prepared. The deposition process of films was controlled where the vacuum was fixed at ≈10⁻⁵ Pa, the film thickness at 7500 Å, and the rate of deposition at ≈100 Å/s. These prepared films have been annealed under vacuum at 500⁰C for 2-hrs. X-ray diffraction, XRD study confirmed the crystallinity nature of annealed Cd_xZn_1-xSe films with a face-centered cubic structure, which is transformed into a hexagonal structure with increasing the cadmium. Energy-dispersive X-ray analysis shows that there is good consistency between the detected and selected element ratios. Scherrer, Williamson-Hall, Size-Strain plot, and Halder-Wagner methods were used to examine the crystallite size and microstrain using XRD peak-broadening analysis. According to the Williamson-Hall method the crystallite size increased from 14.70 nm to 31.30 nm and microstrain decreased from 14.19×10⁻³ to 7.29×10⁻³. The Cd-addition leads to improving the film crystallinity and reducing the crystal imperfections.

热蒸发锌-硒化镉（Cd的_X的Zn _1-x Se）的薄膜具有不同的镉浓度（0.0$\le X\le 1.0,$ at%) 已准备好。控制薄膜的沉积过程，其中真空固定在≈10 ^-5  Pa ，薄膜厚度为7500 Å，沉积速率为≈100 Å/s 。这些制备的薄膜已在 500⁰C 下真空退火 2 小时。X 射线衍射、XRD 研究证实了退火 Cd _x Zn _1-x的结晶性质Se 膜具有面心立方结构，随着镉的增加转变为六方结构。能量色散X射线分析表明，检出元素比与选定元素比具有良好的一致性。Scherrer、Williamson-Hall、尺寸-应变图和 Halder-Wagner 方法用于使用 XRD 峰展宽分析来检查微晶尺寸和微应变。根据威廉姆森霍尔方法，微晶尺寸从 14 增加。70 nm 至 31 . 30 nm 和微应变从14.19 × 10 ^-3降低到7.29 × 10 ^-3 。Cd-添加导致改善薄膜结晶度并减少晶体缺陷。