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Statistical analysis of 12 years of standardized accelerated aging in photovoltaic-module certification tests
Progress in Photovoltaics ( IF 6.7 ) Pub Date : 2021-07-12 , DOI: 10.1002/pip.3450
Paul Gebhardt 1 , Georg Mülhöfer 1 , Arnd Roth 2 , Daniel Philipp 1
Affiliation  

Accelerated aging tests according to international standards (IEC 61215 and IEC 61730) have been used for many years to investigate photovoltaic (PV) module reliability. In this publication, we share a thorough analysis of the tests that were acquired over a time span of 12 years across a wide range of technologies and module generations. The results can serve as a valuable reference to evaluate the reliability of module types and prototypes beyond the use of standardized pass/fail criteria. Furthermore, this work can contribute to ongoing revisions of these standards. In more technical depth, we share the failure rates of different accelerated aging tests. We further discuss trends that are apparent over the investigated decade and reveal which test sequences have become the most relevant to differentiate different PV module types in terms of reliability.

中文翻译:

光伏组件认证测试12年标准化加速老化统计分析

根据国际标准(IEC 61215 和 IEC 61730)的加速老化测试已被用于研究光伏 (PV) 模块的可靠性多年。在本出版物中,我们分享了对 12 年时间跨度内各种技术和模块世代进行的测试的全面分析。结果可以作为评估模块类型和原型的可靠性的宝贵参考,超出使用标准化的通过/失败标准。此外,这项工作有助于对这些标准的持续修订。在更多的技术深度,我们分享不同加速老化测试的故障率。
更新日期:2021-07-12
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