The theory of spin noise in low-dimensional systems and bulk semiconductors is reviewed. Spin noise is usually detected by optical means continuously measuring the rotation angle of the polarization direction of a probe beam passing through a sample. Spin noise spectra yield rich information about the spin properties of the system, for example, g-factors of the charge carriers, spin relaxation times, parameters of the hyperfine interaction, spin-orbit coupling constants, frequencies and widths of the optical resonances. The review describes basic models of spin noise, methods to theoretically describe it, and their relation to experimental results. We also discuss the relation between spin noise spectroscopy and strong and weak quantum measurements, as well as spin flip Raman scattering, and analyze similar effects, including manifestations of the charge, current, and valley polarization fluctuations in the optical response. Possible directions for further development of spin noise spectroscopy are outlined.

回顾了低维系统和体半导体中的自旋噪声理论。自旋噪声通常通过连续测量穿过样品的探测光束的偏振方向的旋转角的光学手段来检测。自旋噪声谱产生关于系统自旋特性的丰富信息，例如，g-电荷载流子的因素、自旋弛豫时间、超精细相互作用的参数、自旋轨道耦合常数、光学共振的频率和宽度。这篇综述描述了自旋噪声的基本模型、理论上描述它的方法，以及它们与实验结果的关系。我们还讨论了自旋噪声光谱与强和弱量子测量之间的关系，以及自旋翻转拉曼散射，并分析了类似的效应，包括光响应中电荷、电流和谷极化波动的表现。概述了自旋噪声光谱进一步发展的可能方向。