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Reliability Analysis of SSDs Under Power Fault
ACM Transactions on Computer Systems ( IF 1.5 ) Pub Date : 2016-11-01 , DOI: 10.1145/2992782
Mai Zheng 1 , Joseph Tucek 2 , Feng Qin 3 , Mark Lillibridge 4 , Bill W. Zhao 4 , Elizabeth S. Yang 4
Affiliation  

Modern storage technology (solid-state disks (SSDs), NoSQL databases, commoditized RAID hardware, etc.) brings new reliability challenges to the already-complicated storage stack. Among other things, the behavior of these new components during power faults—which happen relatively frequently in data centers—is an important yet mostly ignored issue in this dependability-critical area. Understanding how new storage components behave under power fault is the first step towards designing new robust storage systems. In this article, we propose a new methodology to expose reliability issues in block devices under power faults. Our framework includes specially designed hardware to inject power faults directly to devices, workloads to stress storage components, and techniques to detect various types of failures. Applying our testing framework, we test 17 commodity SSDs from six different vendors using more than three thousand fault injection cycles in total. Our experimental results reveal that 14 of the 17 tested SSD devices exhibit surprising failure behaviors under power faults, including bit corruption, shorn writes, unserializable writes, metadata corruption, and total device failure.

中文翻译:

电源故障下SSD的可靠性分析

现代存储技术(固态磁盘 (SSD)、NoSQL 数据库、商品化 RAID 硬件等)给已经很复杂的存储堆栈带来了新的可靠性挑战。除其他事项外,这些新组件在电源故障期间的行为(在数据中心中相对频繁地发生)是这个可靠性关键领域中一个重要但大多被忽视的问题。了解新存储组件在电源故障下的表现是设计新的稳健存储系统的第一步。在本文中,我们提出了一种新方法来揭示电源故障下块设备的可靠性问题。我们的框架包括专门设计的硬件,可将电源故障直接注入设备,将工作负载用于压力存储组件,以及检测各种类型的故障的技术。应用我们的测试框架,我们总共使用超过 3000 个故障注入周期测试了来自 6 个不同供应商的 17 个商品 SSD。我们的实验结果表明,17 个测试的 SSD 设备中有 14 个在电源故障下表现出令人惊讶的故障行为,包括位损坏、缩短写入、不可序列化写入、元数据损坏和设备总故障。
更新日期:2016-11-01
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