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A preparation sequence for multi-analysis of µm-sized extraterrestrial and geological samples
Meteoritics and Planetary Science ( IF 2.2 ) Pub Date : 2021-07-07 , DOI: 10.1111/maps.13696
Alice Aléon‐Toppani 1 , Rosario Brunetto 1 , Jérôme Aléon 2 , Zelia Dionnet 1, 3, 4 , Stefano Rubino 1 , Dan Levy 1, 2 , David Troadec 5 , François Brisset 6 , Ferenc Borondics 7 , Andrew King 7 , Michael Zolensky
Affiliation  

With the recent and ongoing sample return missions and/or the developments of nano- to microscale 3-D and 2-D analytical techniques, it is necessary to develop sample preparation and analysis protocols that allow combination of different nanometer- to micrometer-scale resolution techniques and both maximize scientific outcome and minimize sample loss and contamination. Here, we present novel sample preparation and analytical procedures to extract a maximum of submicrometer structural, mineralogical, chemical, molecular, and isotopic information from micrometric heterogeneous samples. The sample protocol goes from a nondestructive infrared (IR) tomography of ~10 to ~70 µm-sized single grains, which provides the distribution and qualitative abundances of both mineral and organic phases, followed by its cutting in several slices at selected sites of interest for 2-D mineralogical analysis (e.g., transmission electron microscopy), molecular organic and mineral analysis (e.g., Raman and/or IR microspectroscopy), and isotopic/chemical analysis (e.g., NanoSIMS). We also discuss here the importance of the focused ion beam microscopy in the protocol, the problems of sample loss and contamination, and at last the possibility of combining successive different analyses in various orders on the same micrometric sample. Special care was notably taken to establish a protocol allowing correlated NanoSIMS/TEM/IR analyses with NanoSIMS performed first. Finally, we emphasize the interest of 3-D and 2-D IR analyses in studying the organics–minerals relationship in combination with more classical isotopic and mineralogical grain characterizations.

中文翻译:

用于微米级地外和地质样品多重分析的制备序列

随着最近和正在进行的样品返回任务和/或纳米到微米级 3-D 和 2-D 分析技术的发展,有必要开发允许不同纳米到微米级分辨率组合的样品制备和分析协议技术,既能最大限度地提高科学成果,又能最大限度地减少样品损失和污染。在这里,我们提出了新的样品制备和分析程序,以从微米级异质样品中最大程度地提取亚微米结构、矿物学、化学、分子和同位素信息。样品协议从约 10 到约 70 µm 单颗粒的无损红外 (IR) 断层扫描,提供矿物和有机相的分布和定性丰度,然后在选定的感兴趣部位切成几片,用于二维矿物学分析(例如,透射电子显微镜)、分子有机物和矿物分析(例如,拉曼和/或红外显微光谱)和同位素/化学分析(例如,纳米SIMS)。我们还在这里讨论了聚焦离子束显微镜在协议中的重要性、样品损失和污染问题,以及最后在同一测微样品上以不同顺序组合连续不同分析的可能性。特别注意建立一个协议,允许先进行 NanoSIMS/TEM/IR 相关分析。最后,我们强调了 3-D 和 2-D IR 分析在研究有机物-矿物关系以及更经典的同位素和矿物颗粒表征方面的兴趣。
更新日期:2021-07-19
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