Near-field scanning microwave microscopy is a technique with increasing popularity for the study of nanometer-scale electrical properties of samples. Here, we present an approach to quantify sample properties in images obtained with an inverted scanning microwave microscope (iSMM), recently introduced by our group. In particular, this study reports the analysis of the local electrical conductivity of a platinum diselenide sample and proves its semimetal behavior. The approach is validated by a full-wave numerical model, reproducing the complete iSMM operation as well as all steps of the calibration algorithms. To extract local sample properties, this article provides two calibration procedures, respectively, for transmission and reflection mode measurements, based on a two-port equivalent circuit of the iSMM. This enables the high-frequency quantitative characterization of a wide variety of samples and surfaces.

中文翻译：

---

用倒置扫描微波显微镜定量表征二硒化铂电导率

近场扫描微波显微镜是一种越来越受欢迎的技术，用于研究样品的纳米级电学特性。在这里，我们提出了一种量化使用倒置扫描微波显微镜 (iSMM) 获得的图像中的样本特性的方法，该显微镜最近由我们的团队引入。特别是，本研究报告了二硒化铂样品的局部电导率分析并证明了其半金属行为。该方法通过全波数值模型进行验证，重现完整的 iSMM 操作以及校准算法的所有步骤。为了提取局部样本特性，本文基于 iSMM 的双端口等效电路，分别提供了两种校准程序，分别用于传输和反射模式测量。