In this study, AISI 316L stainless steel was passivated under galvanostatic conditions in citric acid solutions in the absence and presence of hydrogen peroxide (H₂O₂). The electronic-semiconducting properties of the resulting passive layers were assessed using Mott–Schottky (MS) analysis. Moreover, the corrosion resistance of the passivated alloy produced under different experimental conditions was examined using cyclic potentiodynamic polarization and electrochemical impedance spectroscopy test methods. The passive films were also characterized using grazing incidence X-ray diffraction. The MS results revealed that higher passivating current densities foster film formation, leading to lower concentration of charge carriers, which beneficially influences the corrosion performance of the alloy. Besides, the addition of H₂O₂ to the passivating electrolyte was accompanied by deterioration of passive film properties and inferior corrosion resistance. The DC and AC corrosion test results were also consistent with those of the MS approach. Last, but not least, the samples that were surface treated in H₂O₂-containing baths, especially those passivated at higher current densities, were more prone to localized attack compared to their counterparts produced in H₂O₂-free electrolyte.

在这项研究中，AISI 316L 不锈钢在过氧化氢 (H ₂ O ₂）。使用莫特-肖特基 (MS) 分析评估所得无源层的电子半导体特性。此外，使用循环动电位极化和电化学阻抗谱测试方法检查了在不同实验条件下生产的钝化合金的耐腐蚀性。钝化膜还使用掠入射 X 射线衍射进行表征。MS 结果表明，较高的钝化电流密度促进了薄膜的形成，导致载流子浓度较低，这对合金的腐蚀性能产生了有益的影响。此外，加入 H ₂ O ₂钝化电解液伴随着钝化膜性能的恶化和较差的耐腐蚀性。直流和交流腐蚀测试结果也与 MS 方法的结果一致。最后，但并非最不重要的，这是在表面H处理的试样₂ ö ₂含浴，特别是那些在较高的电流密度钝化，相比于H中产生的它们的对应的患者更容易局部腐蚀₂ ö ₂ -free电解质。