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Characterization of AlGaN/GaN based HEMT for low noise and high frequency application
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields ( IF 1.6 ) Pub Date : 2021-06-30 , DOI: 10.1002/jnm.2932
Shashank Kumar Dubey 1 , Meena Mishra 2 , Aminul Islam 1
Affiliation  

This article presents a detailed study on AlGaN/GaN based HEMT for DC (such as ID − VDS, ID − VGS and gm), RF (such as cut off frequency, fT and maximum oscillation frequency, fMAX) and noise parameters (such as minimum noise figure (NFmin), noise resistance (Rn) and optimum reflection coefficient (Гopt)). AlGaN/GaN based HEMT having gate length 250 nm and 500 nm have been simulated and verified on the Silvaco TCAD tool.

中文翻译:

用于低噪声和高频应用的基于 AlGaN/GaN 的 HEMT 的表征

本文详细介绍了基于 AlGaN/GaN 的 HEMT,用于 DC(例如I D  −  V DSI D  −  V GSg m)、RF(例如截止频率f T和最大振荡频率 f MAX ) 和噪声参数(例如最小噪声系数 ( NF min )、噪声电阻 ( R n ) 和最佳反射系数 ( Г opt ))。栅极长度为 250 nm 和 500 nm 的基于 AlGaN/GaN 的 HEMT 已在 Silvaco TCAD 工具上进行了模拟和验证。
更新日期:2021-06-30
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