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A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability
ACM Transactions on Design Automation of Electronic Systems ( IF 1.4 ) Pub Date : 2021-06-28 , DOI: 10.1145/3462171
Dave Y.-W. Lin, Charles H.-P. Wen

As the demand of safety-critical applications (e.g., automobile electronics) increases, various radiation-hardened flip-flops are proposed for enhancing design reliability. Among all flip-flops, Delay-Adjustable D-Flip-Flop (DAD-FF) is specialized in arbitrarily adjusting delay in the design to tolerate soft errors induced by different energy levels. However, due to a lack of testability on DAD-FF, its soft-error tolerability is not yet verified, leading to uncertain design reliability. Therefore, this work proposes Delay-Adjustable, Self-Testable Flip-Flop (DAST-FF), built on top of DAD-FF with two extra MUXs (one for scan test and the other for latching-delay verification) to achieve both soft-error tolerability and testability. Meanwhile, a built-in self-test method is also developed on DAST-FFs to verify the cumulative latching delay before operation. The experimental result shows that for a design with 8,802 DAST-FFs, the built-in self-test method only takes 946 ns to ensure the soft-error tolerability. As to the testability, the enhanced scan capability can be enabled by inserting one extra transmission gate into DAST-FF with only 4.5 area overhead.

中文翻译:

具有软错误容忍度和延迟故障可测试性的延迟可调、自测触发器

随着安全关键应用(例如,汽车电子)需求的增加,提出了各种抗辐射触发器来提高设计可靠性。在所有触发器中,Delay-Adjustable D-Flip-Flip (DAD-FF) 专门用于在设计中任意调整延迟,以容忍不同能级引起的软错误。然而,由于 DAD-FF 缺乏可测试性,其软错误容忍性尚未得到验证,导致设计可靠性不确定。因此,这项工作提出了延迟可调、自测触发器 (DAST-FF),它建立在 DAD-FF 之上,具有两个额外的 MUX(一个用于扫描测试,另一个用于锁存延迟验证),以实现软- 容错性和可测试性。同时,在 DAST-FF 上还开发了一种内置自测试方法,以验证操作前的累积锁存延迟。实验结果表明,对于具有 8,802 个 DAST-FF 的设计,内置自测试方法仅需 946 ns 即可确保软错误容忍度。至于可测试性,可以通过在 DAST-FF 中插入一个额外的传输门来启用增强的扫描能力,只需 4.5 个区域开销。
更新日期:2021-06-28
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