Residual current device (RCD), the critical equipment to protect the safety of electrical users, are known to experience performance degrade over time during their use lifetime. Therefore, in order to promptly replace the RCD before failure, it is very important to predict its lifetime. In order to predict the remaining life of the RCD, a constant-stress accelerated degradation test (CSADT) and a combination prediction model are proposed. First, the CSADT is conducted with temperature as the acceleration stress and the residual operating current as degradation characteristic. Then, based on the prediction result of pseudo failure life, a combination model of Wiener process and GM (1, 1) model is given. Finally, the remaining life of the RCD under normal use environment is extrapolated. © 2021 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC.

中文翻译：

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基于Wiener过程的GM(1,1)模型剩余电流装置寿命预测

众所周知，剩余电流装置 (RCD) 是保护电气用户安全的关键设备，在其使用寿命期间会随着时间的推移而性能下降。因此，为了在发生故障前及时更换RCD，预测其使用寿命非常重要。为了预测RCD的剩余寿命，提出了恒应力加速退化试验（CSADT）和组合预测模型。首先，CSADT 以温度为加速应力，剩余工作电流为退化特性。然后，基于伪失效寿命的预测结果，给出了维纳过程和GM(1, 1)模型的组合模型。最后，外推RCD在正常使用环境下的剩余寿命。© 2021 日本电气工程师学会。