The inverter-based shunt-feedback transimpedance amplifier (TIA) has become an essential building block for high-speed receivers for optical interconnects in advanced technologies due to its low operating voltage and high efficiency. Previously, the design of TIA’s optimal noise is based on the relationship between the photodetector’s capacitance, \(C_{{\mathrm {D}}}\), and the TIA’s capacitance, \(C_{{\mathrm {I}}}\). In this paper, we present a method to calculate the accurate size of the inverter-based amplifier, feedback resistance \(R_F\), and load capacitance \(C_o\) for the optimal noise. Next, we further discuss the impact of the quality factor, channel length, and input parasitics on these parameters. Our analysis is applied to 65 nm CMOS technology based on MATLAB calculations. The predicted results agree well with the simulation results, offering valuable interpretations and conclusions that reveal the inherent tradeoffs among noise, data rate, and power consumption in the broadband optical TIA.

由于其低工作电压和高效率，基于逆变器的并联反馈跨阻放大器 (TIA) 已成为先进技术中用于光互连的高速接收器的重要组成部分。以前，TIA 最佳噪声的设计基于光电探测器电容\(C_{{\mathrm {D}}}\)和 TIA 电容\(C_{{\mathrm {I}}}} 之间的关系\)。在本文中，我们提出了一种计算基于逆变器的放大器、反馈电阻\(R_F\)和负载电容\(C_o\)的准确尺寸的方法为最佳噪声。接下来，我们进一步讨论品质因数、通道长度和输入寄生参数对这些参数的影响。我们的分析基于 MATLAB 计算应用于 65 nm CMOS 技术。预测结果与仿真结果非常吻合，提供了有价值的解释和结论，揭示了宽带光学 TIA 中噪声、数据速率和功耗之间的固有权衡。