The Rydberg electromagnetically induced transparency (EIT)–Autler Townes (AT) splitting proportional to the target microwave electric field strength is an atom-based primary traceable standard in microwave electrometry. The minimum detected microwave electric field is limited when the EIT-AT splitting is indistinguishable. We design a method for auxiliary microwave-dressed Rydberg atoms that extends the electrometric span. We theoretically and experimentally show that the low bound of the direct SI-traceable microwave electric field is extended by two orders of magnitude, which is from several mV/cm to $\mu \mathrm{V}/\mathrm{cm}$ in a room-temperate Rb cell with a modest setup.

中文翻译：

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用辅助微波场修饰的里德堡原子量子微波电测的跨度位移和扩展

与目标微波电场强度成正比的 Rydberg 电磁感应透明 (EIT)-Autler Townes (AT) 分裂是微波静电测量中基于原子的主要可追溯标准。当 EIT-AT 分裂无法区分时，最小检测到的微波电场受到限制。我们为辅助微波处理的里德堡原子设计了一种方法，可扩展电测跨度。我们从理论上和实验上表明，直接 SI 可追踪微波电场的下界扩展了两个数量级，从几个 mV/cm 到$\mu \mathrm{伏}/\mathrm{厘米}$ 在具有适度设置的室温 Rb 电池中。