This paper proposes an innovative method for Integral Nonlinearity (INL) testing, that allows to measure the voltage corresponding only to a subset of all the codes of Digital-to-Analog Converters (DAC), shortening the duration of static characterization. The method operates, in fact, a pseudo-random selection of DAC codes to be tested but, through Compressed Sensing, it is able to recover the INL value for all the codes. The proposed method is experimentally evaluated on two DACs with different architectures and thus with different trends of the INL curve. In the performed tests, the recovered curve results very close to the INL curve obtained by the standard approach, while allowing a considerable time saving.

本文提出了一种积分非线性 (INL) 测试的创新方法，它允许测量仅对应于数模转换器 (DAC) 的所有代码的一个子集的电压，从而缩短了静态表征的持续时间。该方法实际上是对待测试的 DAC 代码进行伪随机选择，但通过压缩感知，它能够恢复所有代码的 INL 值。所提出的方法在具有不同架构的两个 DAC 上进行了实验评估，因此具有不同的 INL 曲线趋势。在执行的测试中，恢复曲线的结果非常接近通过标准方法获得的 INL 曲线，同时可以节省大量时间。