当前位置: X-MOL 学术Microscopy › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Improved efficiency in automated acquisition of ultra-high-resolution electron holograms using automated target detection
Microscopy ( IF 1.8 ) Pub Date : 2021-06-08 , DOI: 10.1093/jmicro/dfab021
Fumiaki Ichihashi 1 , Toshiaki Tanigaki 1 , Tetsuya Akashi 1 , Yoshio Takahashi 1 , Kohei Kusada 2 , Takehiro Tamaoka 3 , Hiroshi Kitagawa 2 , Hiroyuki Shinada 1 , Yasukazu Murakami 3, 4
Affiliation  

An automated hologram acquisition system for big-data analysis and for improving the statistical precision of phase analysis has been upgraded with automated particle detection technology. The coordinates of objects in low-magnification images are automatically detected using zero-mean normalized cross-correlation with preselected reference images. In contrast with the conventional scanning acquisitions from the whole area of a microgrid and/or a thin specimen, the new method allows efficient data collections only from the desired fields of view including the particles. The acquisition time of the cubic/triangular nanoparticles that were observed was shortened by about one-fifty eighth that of the conventional scanning acquisition method because of efficient data collections. The developed technology can improve statistical precision in electron holography with shorter acquisition time and is applicable to the analysis of electromagnetic fields for various kinds of nanoparticles.

中文翻译:

使用自动目标检测提高超高分辨率电子全息图自动采集的效率

用于大数据分析和提高相位分析统计精度的自动全息图采集系统已通过自动粒子检测技术进行了升级。使用与预选参考图像的零均值归一化互相关自动检测低倍率图像中对象的坐标。与从微网格和/或薄标本的整个区域进行的传统扫描采集相比,新方法仅允许从包括粒子在内的所需视场进行有效的数据收集。由于有效的数据收集,观察到的立方/三角形纳米颗粒的采集时间比传统扫描采集方法缩短了约八分之一。
更新日期:2021-06-08
down
wechat
bug